Test chips built in a 32nm bulk CMOS technology consisting of hardened and non-hardened sequential elements have been exposed to neutrons, protons, alpha-particles and heavy ions. The radiation robustness of two types of circuit-level soft error mitigation techniques has been tested: 1) SEUT (Single Event Upset Tolerant), an interlocked, redundant state technique, and 2) a novel hardening technique referred to as RCC (Reinforcing Charge Collection). This work summarizes the measured soft error rate benefits and design tradeoffs involved in the implemented hardening techniques.

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This paper describes the development of a sensor for the detection of viruses. The detection scheme uses sense and dummy capacitors and a sense amplifier circuit to compare capacitance values. The presence of sufficient biological material within the sense capacitor alters the sense amplifier output. This promising approach has the potential to more rapidly test for the presence of virus using an IC platform.

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