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The present state of the art of transparent, electrically conducting films, with special reference to In203, SnO2 and Cd2SnO4, has been reviewed. Various production techniques currently in use, and typical parameters used in the processes have been discussed in detail. Electrical and optical properties of these films have been reported as a function of various parameters, e.g. substrate temperature, doping, oxygen pressure, etc. Finally, the applications of these films in research and industry have been discussed in detail.

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Laser-induced damage studies have been carried out on single-crystal silicon and silicon-based photodetectors, FND 100 P-I-N photodiodes, and C30954E avalanche photodiodes as a function of repetition frequency for a 1064-nm wavelength. It has been observed that the damage threshold decreases significantly when the samples are irradiated with a large number of pulses. However, this effect is evident only when the repetition frequency is greater than 1 Hz. The results are discussed in light of various existing theories.