This paper focuses on designing an efficient test strategy (plan) for a set of microprocessor systems. The problem is examined as a composite one. A four-stage solving scheme is suggested. The following underlying models are used: (i) multicrteria ranking, (ii) knapsack-like problems (e.g., multicrtieria multiple choice problem), (iii) clustering, and (iv) multicriteria assignemnt/allocation.The solving scheme consists of the following stages: (1) clustering of microprocessor systems under consideration; (2) clustering of groups of testers; (3) assignment of tester groups clusters into clusters/groups of microprocessor systems; and (4) solving a multicriteria multiple choice problem to select a certain test actions for each pair ("assignment") 'microprocessor system cluster/group -cluster of test-groups'.An numerical example for a set of 52 microprocessors systems illustrates the suggested approach.