Articles you may be interested inA simple double-focusing electrostatic ion beam deflector Rev. Sci. Instrum. 81, 063304 (2010); 10.1063/1.3433485Focusing of laser-generated ion beams by a plasma cylinder: Similarity theory and the thick lens formula Phys. Plasmas 13, 063103 (2006); Characteristics of focused beam spots using negative ion beams from a compact surface plasma source and merits for new applications A figure of merit ͑FOM͒ has been developed for focusing quadrupole multiplet lenses for ion microand nanobeam systems. The method which is based on measurement of the central peak of the two-dimensional autocorrelation function of an image provides separate FOM for the horizontal and vertical directions. The approach has been tested by comparison with the edge widths obtained by nonlinear fitting the edge widths of a Ni grid and found to be reliable. The FOM has the important advantage for ion beam imaging of biomedical samples that the fluence needed is considerably lower than for edge fitting.

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