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Nominal PbSe nano-islands were grown in the Stranski-Krastanow mode on (111) oriented PbTe/BaF 2 pseudo-substrates by molecular beam epitaxy (MBE). The morphology and number density of these islands were assessed by means of atomic force microscopy (AFM). Transmission electron microscopy (TEM) was employed to determine the strain state and crystallographic structure of these islands. On the basis of both AFM and TEM analyses, we distinguish between different groups of islands.