An algorithm for calculating optical waveguide film parameters was proposed, the use of which makes it possible to reduce the time for processing experimental data. The developed algorithm was tested using experimental data of waveguides samples with a wave-guiding layer of zirconium dioxide sol-gel films. A comparison of the developed algorithm and the Wolfram Mathematica program showed a good agreement of the results, as well as the developed method advantage in terms of using ease and timesaving spent on processing the results.

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