Thin films of (Poly Pyrrole - Poly Vinyl Alcohol) PPY-PVA polymer blend doped with different concentration of TiO2 nano particles were prepared via oxidative chemical polymerization technique (in-situ). The properties (Structural & Optical) of these thin films were studied by XRD, FTIR, SEM and UV spectroscopic techniques. The optical band gap values of TiO2 doped polymer blend were calculated by UV spectroscopic studies, and also noticed that obtained band gap values were decreased with increase in the concentration of TiO2 nano particles. XRD and FTIR results support the polymer blend formation, and dispersion of TiO2 nano particles in the polymer blend. The modification in surface morphology of polymer blend is due to presence of TiO2 nano particles which was confirmed by SEM results.

Poly Vinyl Alcohol (PVA), Poly Pyrrole (PPY), and PPY-PVA blend thin films loaded with varying concentrations of nano TiO2 particles were prepared by using the in-situ chemical oxidative polymerization technique. Prepared films have undergone several characterization techniques i.e., XRD, UV- Spectroscopy, SEM, and DSC to study their structural, morphological, optical, and thermal properties. SEM images revealed that the surface morphology of PPY has been significantly modified upon the addition of PVA and nano TiO2 particles and observed the presence of pores on the surface. XRD spectra disclose that the amorphous nature of PPY whereas semi-crystalline nature of PVA and the amorphous nature of PPY-PVA blend thin film, also revealed that the concentration of dopant imparts the crystallinity to the nanocomposite thin films. The DSC thermographs confirmed that the shifting of melting temperature towards the higher temperature side in PPY-PVA blend thin film compared to pure PPY and PVA and the addition of dopant has changed melting points towards slightly lower temperature side. Direct band gap values of prepared thin films have been calculated by plotting UV graphs, and these were diminished as rising in the concentration of dopant which supports the conductivity level of thin films.