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A choosing process for the sampling delay in the dye sensitized solar cells I–V characterization method was established. The presented method is based on the stepwise varying bias voltage technique. The analyses were based on the solar cell transient current impact on the cell I–V acquisition. This process presents a method to correctly fix the I–V scan sampling delay concerning the cell settling time to obtain accurate dye sensitized solar cells performance measures. It allows a faster acquisition compared to classical measurement method to avoid the solar cell heating. All tests were performed on a typical TiO2 natural‐dyed solar cell, dedicated to laboratory tests. The cell manufacturing process was also discussed. Measures were operated by a laboratory developed digital acquisition board. The system architecture, as well as its operating algorithm, was presented.

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