The features of X-ray fluorescence analysis of chalcogenide glassy semiconductors are considered in the research. The standard method was used to determine the concentrations of arsenic and selenium AsxSe1-xalloys. The use of this method allows determining the quantitative composition of glasses with an accuracy of ± 0.0002.

The article presents an X-ray fluorescence analysis of chalcogenide glassy semiconductors. The standard method is applied to determine the concentration of arsenic, selenium, and sulfur in alloys. This technique, the quantitative composition of the glasses is defined with an accuracy of ± 0.0002.

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