By using a polarization-modulation technique in combination with reflection-mode scanning near-field optical microscopy we are able to determine quantitatively the local polar Kerr rotation on thin magnetic films. As an example, the magneto-optic contrast of magnetic domains thermomagnetically written on a Co/Pt sample is discussed. The size of the magnetic domains is 3×0.5 μm2 and the angular resolution of the local Kerr rotation is better than 0.1°. This measurement technique will make it possible to investigate, e.g., the fine structure of domain walls by scanning near-field optical microscopy.

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Zusammenfassung Informationstechnik befähigt moderne Produktionssysteme dazu, sich entsprechend der Marktanforderungen zu wandeln, im Netzwerk zu arbeiten und in Echtzeit Informationen auszutauschen. Die Integration vorhandener und neuer IT-Systeme spielt dabei eine immer bedeutendere Rolle, um Geschäftsprozesse durchgängig zu unterstützen. Basis dieser Integration sind Mechanismen zur Interoperabilität, von denen einige in diesem Heft vorgestellt werden. Die Autoren dieses Betrags beschreiben die Dimensionen der Interoperabilität auf der Fertigungsleitebene.

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In scanning near-field optical microscopy the sample topography may have a strong effect on the optical image signal. This cross talk has been investigated in subwavelength-periodically patterned thin-film structures using a reflection-mode near-field optical microscope. A comparison between measured and simulated line scans shows that far-field light waves emitted from the tip aperture play a major role in the imaging process.