(XRD) characterizations. The FTIR analysis confirmed the formation of GO. Although some restacking/unexfoliated graphite structures showed a diffraction peak at 2θ of 26.54, the XRD analysis clearly exhibited a peak at 2θ of 20.04, assigned to rGO after reduction of the GO. The smallest particle size of rGO was observed in the range of 1 to 10 m when under ultrasonication time of 1 h and Zn mass of 8 g. The FTIR spectrum of GO showed that there was a functional group C=C, which is an indication of rGO formation due to the covalent bonding of the graphene structure. SEM image of the rGO showed that the morphology seemed thick and layer stacking. The quality of rGO produced in this study needs to be improved further to meet requirements for applications.