The degradation of organic materials was often observed during XPS measurement. We have evaluated the degradation of silicon wafers modified with 3,3,3-trifluoropropyltrimethoxysilane (F3PTMS-Si), 3-chloropropyltriethoxysilane (CPTES-Si), 3-bromopropyltrimethoxysilane (BPTMS-Si) and 3-iodopropyltrimethoxysilane (IPTMS-Si), and gold substrate modified with 1H,1H,2H,2H-perfluorodecanthiol (PFDT-Au) as reference material in order to investigate influence of C-F, C-Cl, C-Br and C-I bonds in the organic silane monolayers. As a result, the order of damaging factor, β, was IPTMS-Si > BPTMS-Si > CPTES-Si > F3PTMS-Si. It was found that the value of β was related to the chemical bond energy of C-X(X=F, Cl, Br, I).

In this research, we suggest a methodology for getting joint angles by Kinect sensor for rehabilitation evaluation support. We measured the motion of the arm of a patient with hemiplegia before and after the rehabilitation, and showed the range of the motion by using genetic algorithm. The range after the rehabilitation was bigger than before the rehabilitation. Based on this result, our methodology is able to evaluate the change of the motion before and after the rehabilitation for patients with hemiplegia.