In the current status, we have successfully synthesized lead sulfide (PbS) thin films using a modified successive ionic layer absorption and reaction (SILAR) method. The synthesized film was characterized using UV-Vis-NIR spectrophotometer, X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM) techniques for optical, structural and morphological properties. Opto-structural study demonstrates that synthesized thin film has a pure crystal structure. The surface morphology study indicates a nanospherical surface morphology without pinhole on the substrate surfaces. Overall study clearly demonstrates that the synthesized PbS thin film by SILAR method have great potential for sensitization of oxide microstructure.