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Absarrd--Mognetic perpendicular anisotropy constants of RF-sputtered amorphous TbFe thin films were measured by VSM and mngnetwptic techniques. Anisotropy depended heady 011 fUm thickness. We have found that the spontaneous magnetization changed with thickness in the same fashion as in the presence of a very thin (1 mu) highly magnetized interface layer. Msotropy measured from the top and bottom Alm surfaces revealed very different dependence on the deposition panmeten Because the magnetization reversal is incoherent due to the different anisotropy fields in the surface layers and in the bulk, it is necessary to account for the reversal mechanism to evaluate the true value of intrinsic anisotropy of the amorphous alloy.

Mossbauer spectroscopy and magneto-optical (MO) studies of thin amorphous TbxFe100_xfilms (11