In this work, we present the extensive electrical characterization of 4kb Phase-Change Memory (PCM) arrays based on "Wall" structure and Ge-rich GeSbTe (GST) material, integrating a SiC dielectric with low thermal conductivity surrounding the heater element for enhanced cell thermal efficiency. We investigate the effects of the introduction of such dielectrics on the electrical performances of the device and we provide a promising path to achieve energy-efficient PCM cells supporting our results by electro-thermal TCAD simulations.