We review published literature from 1975 to the present for accelerated stress testing of flat‐plate terrestrial photovoltaic (PV) modules. An important facet of this subject is the standard module test sequences that have been adopted by national and international standards organizations, especially those of the International Electrotechnical Commission (IEC). The intent and history of these qualification tests, provided in this review, shows that standard module qualification test results cannot be used to obtain or infer a product lifetime. Closely related subjects also discussed include: other limitations of qualification testing, definitions of module lifetime, module product certification, and accelerated life testing. Copyright © 2008 John Wiley & Sons, Ltd.

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The emission of light from each junction in a seriesconnected multij unction solar cell both complicates and elucidates the understanding of its performance under arbitrary conditions. Bringing together many recent advances in this understanding, we present a general 1-D model to describe luminescent coupling that arises from both voltage-driven electroluminescence and voltage-independent photoluminescence in nonideal junctions that include effects such as Sah-Noyce-Shockley (SNS) recombination with n * 2, Auger recombination, shunt resistance, reverse-bias breakdown, series resistance, and significant dark area losses. The individual junction voltages and currents are experimentally determined from measured optical and electrical inputs and outputs of the device within the context of the model to fit parameters that describe the devices performance under arbitrary input conditions. Techniques to experimentally fit the model are demonstrated for a four-junction inverted metamorphic solar cell, and the predictions of the model are compared with concentrator flash measurements.