These findings suggest that microRNAs play a role in age-related cataracts. A local let-7b microRNA increase may represent a risk factor in the formation of age-related cataracts.

Three dimensional (3D) stress distributions in Si, surrounded by copper (Cu) filled through silicon vias (TSVs) with various dimensions and pitches, are non-destructively characterized and stress contour maps generated at different depths using a long focal length, polychromator-based, multi-wavelength micro-Raman spectroscopy system. It was found that stress and crystallinity in Si (in both planar and depth directions) was strongly influenced by the proximity to a TSV, as well as, the dimensions of the TSV. In addition to characterizing semiconductor materials, Multi-wavelength micro-Raman spectroscopy was extremely effective for characterizing process-induced variations in crystalline stress and quality where 3D interconnects and packaging technology is introduced.

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