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SUMMARYA method for fault detection probability estimation using statistical multi-parameter circuit simulation is proposed, in order to check circuits for which double or multiple analogue measurements are utilized. Theoretical analysis for the estimation of the fault coverage is given, based on conditional probability calculations. The proposed method can be applied for both test measurement and input stimulus selection. Simulation results from the application of the method on typical analogue circuits-filter and amplifierare given, showing a sufficient improvement over the fault coverage achieved by single measurements.

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