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The relation between the structural peculiarities of crystals of high explosives (HE) and their detonability is analyzed. It is shown that internal defects in HE crystals can significantly influence the critical diameter of detonation. Several technological ways for managing the defects of HE crystals are proposed and, thus, for the size of the critical detonation diameter (or the thickness of the detonating layer). The technique of HE thermal vacuum recrystallization is the best way to create compact devices of explosive logic and automation. This technique provides a significant decrease in the critical diameter of detonation with the maintenance of thermal stability and sensitivity to mechanical effects at the level of factory-manufactured HEs.

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