We developed the novel TFT backplane structure on glass for ultra‐high resolution (1443 ppi) AMOLED VR display. The Mixed TFT backplane based on the combination of bottom‐gate poly‐Si TFTs (BGPs) and top‐gate poly‐Si TFTs (TGPs) has solved many issues such as integrating AMOLED pixel circuit in very small area and retaining TFT characteristics on glass for AMOLED VR display.
ZnO nanorods fabricated on a Zn substrate pre-coated with ZnO as a seed layer by the hydrothermal method were studied mainly as a function of ZnO precursor concentration. Characteristic features by using field-emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD) were investigated to define the changed micro-structure and crystalline phase of the ZnO nanorods according to the experimental conditions. The nanorod morphology strongly depended on the precursor concentration. For example, ZnO nanorods vertically aligned with a hexagonal (002) oriented structure with a diameter of 600~700 nm and length of 6.75 µm were clearly observed at the highest concentration of 0.015 M. The strong hexagonal structure was believed to be associated with the highest photoluminescene (PL) intensity and a promising voltage value of ca. 6.069 V at 1000 µA.
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