The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.

The new optical scheme of refractometer with temperature stabilisation 10−2 °C is developed, which allows measuring a refractive index of the sample with accuracy not worse than 10−5; dependence of refraction index on concentration of SiO2 nanoparticles in liquid suspension is obtained within the framework of the research.

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