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The electrostatic discharge (ESD) sensitivity of ICs with respect to the charged-device model (CDM) is strongly dependent on the IC package, the substrate resistivity, and the effectiveness of the ESD protection network. This paper presents a case study of predictive CDM circuit simulation method based on the tester, package, and full IC modeling approach. Index Terms-Bipolar and complementary metal oxide semiconductor (BiCMOS) integrated circuits (ICs), electrostatic discharge (ESD), SPICE simulations.

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