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Abstract-A new robust method for finding the parameters of Engen's six-port-to-four-port reduction algorithm for sixport reflectometer calibration has been developed. Like other previously published methods, it uses a minimum of five loads with an unknown but constant absolute value of the reflection coefficient and unknown but well-distributed phases. However, the quality of the parameter estimates is improved, especially in noisy environments, by efficiently eliminating cases in which these earlier methods may become ill-conditioned. The new method has been used successfully to calibrate a newly developed six-port reflectometer in GaAs MMIC technology working between 1.3 GHz and 3.0 GHz.Index Terms-Calibration procedure, network analysis, reflection coefficient measurement, six-port reflectometer, S-parameter measurement.

Abstract-This paper presents a new structure for a six-port reflectometer which due to its simplicity can be implemented very easily in monolithic microwave integrated-circuit (MMIC) technology. It uses nonmatched diode detectors with a high input impedance which are placed around a phase shifter in conjunction with a power divider for the reference detector. The circuit has been fabricated using the F20 GaAs process of the GEC-Marconi foundry and operates between 1.3 GHz and 3.0 GHz.Index Terms-Diode detector, integrated circuit, monolithic microwave integrated-circuit (MMIC), phase shifter, power divider, six-port reflectometer, S-parameter measurement.

Abstract-This paper presents two new structures for six-port reflectometers with very large operating bandwidths of more than three decades, using a combination of lumped reflectors and transmission lines. Circuits working over a range of 2 MHz to 1300 MHz and 2 MHz to 2200 MHz have been built using inexpensive passive surface mount elements and Schottky detector diodes. Comparing results obtained from the new proposed structures with those obtained from a commercial network analyzer showed a worst case absolute value of 0.020 for the complex difference between the measured reflection coefficients. A convenient calibration procedure, for the entire band, is proposed using three standards and four approximately known loads.