No abstract

No abstract

No abstract

Due to measurement errors, producers are typically forced to set test limits well within specification limits. The methods used in practice are rather informal and usually conservative with respect to consumer loss, thus leading to unnecessary loss of yield. We present approximations for test limits that are still relatively easy to evaluate and moreover very accurate. In addition, the analytical tractability of these approximations allows extension to the more realistic case in which parameters are estimated.

Specification limits, yield, bivariate normal distribution,