A semiquantitative model is proposed to explain a nanoroughness effect on the Cr growth mechanism. It is shown that nanoroughness is another important factor that affects the Cr texture formation and Cr grain size besides temperature. By properly controlling the nanoroughness of the seed layer, a Cr(200) texture can be induced at low temperature and a small Cr grain size with uniform distribution can be obtained.

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We have fabricated Co/Pd, CoCr/Pd, and CoCrTa/Pd multilayer media. Good recording performance was achieved using a magnetoresistive (MR) head for readback. Co/Pd medium has perpendicular coercivity of 5 kOe and perpendicular squareness ratio of 0.83. The recording performance of a Co/Pd multilayer media was compared to conventional longitudinal media Co86Cr10Ta4 media and perpendicular Co78Cr17Ta5 media. The effects of Cr doping of Co, postdeposition annealing of Co/Pd, annealing the plated NiFe keeper layer, the number of layers in the multilayer, and the oxygen concentration of sputtering gas on the noise spectra of media were studied.

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