Measurements of the absolute intensities of discharge gas and trace elements/isotopes can help to understand the ionization mechanism and contribute to the reduction in uncertainty related to the relative sensitivity factor (RSF).

We demonstrate and compare indium and silicon as secondary cathode material for the analysis of flat, solid alumina and sapphire matrices by direct-current glow discharge mass spectrometry (dc-GDMS). The mask...

It is likely that observation of roughness at crater bottom upon GDMS sputtering is due to differential sputtering of grains.

Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires the use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials...