Due to the decreasing metal line size on complicated integrated circuit, non-destructive analysis strategy such as EMMI (Emission Microscope) is very significant to failure analysis, especially when special cold temperature failures are encountered. When combined with efficient schematic and layout analysis, the real defect can be localized without much microprobe work.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.