Abstract-This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines,The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method will be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements will be presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.
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