International audienceNanostructured chalcopyrite CuAl0.5Ga0.5Te2 has been prepared by milling a mixture of reactants, copper, aluminum, gallium, and tellurium. The crystal structure, morphology, and composition of the prepared samples have been characterized by means of x-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive spectrometry (EDS), and transmission electron microscopy (TEM). X-ray diffraction has revealed the presence of the characteristic peaks of the chalcopyrite phase for the CuAl0.5Ga0.5Te2-milled powders. The crystallite size and internal strain have been evaluated by XRD patterns using the Williamson–Hall method. The average particle size decreases as the milling time is prolonged, while the lattice parameters and internal strain increase. The TEM confirmed the formation of CuAl0.5Ga0.5Tee nanoparticles. The bandgap has been found to increase from 1.42 eV up to 1.45 eV as the process time varies, respectively, from 60 min to 360 min
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