Based on the reduction and redundancy methods, the reliability performance of the improved general series-parallel system is considered, assuming the connected components are identically independent and follow the general exponential lifetime model. To extend previous studies, the shape parameter is modified to obtain the reliability equivalence factors of the hot and cold duplications. A hybrid of the hot and cold duplication methods is also considered. Numerical results from a practical example are investigated to illustrate the derived theoretical results of the overall study.
In this paper, the weighted Kolmogrov-Smirnov, Cramer von-Miss and the Anderson Darling test statistics are considered as goodness of fit tests for the generalized Rayleigh interval grouped data. An extensive simulation process is conducted to evaluate their controlling of type 1 error and their power functions. Generally, the weighted Kolmogrov-Smirnov test statistics show a relatively better performance than both, the Cramer von-Miss and the Anderson Darling test statistics. For large sample values, the Anderson Darling test statistics cannot control type 1 error but for relatively small sample values it indicates a better performance than the Cramer von-Miss test statistics. Best selection of the test statistics and highlights for future studies are also explored.
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