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A computer method for determining the scattering, absorption, and internal field structure of thin flat disks of arbitrary refractive index is described. The code is shown to be accurate for all angles of incidence for radii up to at least two free space wavelengths and for media ranging from pure dielectric to highly conductive ones. The accuracy of the method is assessed by comparison with published experimental data and with results computed by other methods. The applicability of this technique for analyzing clouds of disk-shaped aerosols is also discussed.

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