We present high speed video of Cassie-Baxter to Wenzel drop transition during gentle deposition of droplets where the modest amount of energy is channeled via rapid deceleration into a high water hammer pressure.

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In the framework of the OECD/NRC PSBT benchmark, the subchannel grade void distribution data and DNB data were assessed by a subchannel code, MATRA. The prediction accuracy and uncertainty of the zone-averaged void fraction at the central region of the 5 × 5 test bundle were evaluated for the steady-state and transient benchmark data. Optimum values of the turbulent mixing parameter were evaluated for the subchannel exit temperature distribution benchmark. The influence of the mixing vanes on the subchannel flow distribution was investigated through a CFD analysis. In addition, a regionwise turbulent mixing model was examined to account for the nonhomogeneous mixing characteristics caused by the vane effect. The steady-state DNB benchmark data with uniform and nonuniform axial power shapes were evaluated by employing various DNB prediction models: EPRI bundle CHF correlation, AECL-IPPE 1995 CHF lookup table, and representative mechanistic DNB models such as a sublayer dryout model and a bubble crowding model. The DNBR prediction uncertainties for various DNB models were evaluated from a Monte-Carlo simulation for a selected steady-state condition.

In this paper, the electrical characteristics and reliability of ZrO 2-based metal-insulator-metal (MIM) capacitors are investigated. High capacitance density of 15.3 fF/m 2 was achieved for ZrO 2 MIM capacitors, which is acceptable for the reported MIM capacitors. Schottky emission at the low field region is not a dominant mechanism, and Frenkel-Poole emission is the dominant mechanism at the high electric field region. The extracted dynamic constant and trap energy level were 4.013 and 0.963 eV, respectively. The reduced trap energy level with increasing electric field is due to a rise in the field-induced barrier-lowering effect. The variation of as a function of stress time under constant voltage stress (CVS) gradually decreases, while the variation of ÁC stress =C 0 under CVS increases because the generation of new dipoles in the high-dielectric under CVS may cause charge trapping in the high-dielectric.

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