The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.

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the developed automated test setup for microcontrollers with internal analog-to-digital converters is presented. The solution uses PXI-4110 and PXI-7841R modular instruments and LabVIEW software along with individually designed boards. The article also discusses testing methods of the internal digital and analog blocks of microcontrollers, algorithm of ADC's parameters measurement and electromagnetic interference protection during testing.