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Using data of multiangle spectrophotometry and spectral ellipsometry in the UV and visible ranges, spectra of the refractive indices and absorption coefficients and width of the forbidden band of oneand five-layer strontium titanate films obtained by the sol-gel method have been calculated. Layer-by-layer deposition of sol on quartz substrates, from one to five layers, leads to an increase in film porosity from 4 to 33%. This causes a decrease in the refractive indices in the middle part of the visible spectrum from 2.33 to 1.87, which leads to a decrease in the reflectance and an increase in the transmittance or transparency of fivelayer films. With an increase in the heating temperature of such films from 500 to 750°C, a shift of the absorption band maximum from 239 to 253 nm takes place and the optical width of the forbidden band decreases from 4.63 to 4.20 eV. The absorption band maximum of the single-layer film falls on the wavelength of 252 nm, and its optical width of the forbidden band is 3.96 eV.

The general goal of this work is to study the near‐surface region structure of Cz Si wafers subjected to the low‐temperature (25‐350 °C) low‐energy (300 eV) ion‐beam treatment by hydrogen, helium or argon. The properties of a thin (several nanometers) near‐surface layer of the wafers were investigated using the X‐ray absorption near edge structure (XANES), X‐ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry methods.Based on the conducted study, it was concluded that the ion beam treatment leads to (i) the formation of an oxide layer on the surface and to (ii) silicon amorphization. It is demonstrated that increase of the hydrogen ion‐beam treatment temperature results in (i) improvement of the oxide quality; (ii) reduced thickness of the transition region between the formed oxide layer and silicon bulk (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

The functions of the main indices of refraction n(ν) and absorption κ(ν) of uniaxial thin polyethylene terephthalate films have been calculated by the experimental spectra of frustrated total reflection of s-and p-polarized radiation in the 700-760-cm −1 range. The κ o (ν) maximum falls at the the 727-cm −1 frequency and the maximum of κ e (ν) falls at the the 724-and 732-cm −1 frequencies.