The growth of a cultivated typical brain tumor is studied in this work. The tumor is analyzed both dynamically and morphologically. We have measured its fractal dimension to be d f 1.21 6 0.05. From its dynamical behavior we determine the scaling critical exponents of this circular symmetry system which are compatible with the linear molecular beam epitaxy universality class. A very important feature of tumor profiles is that they are super-rough, which constitutes the first (1 1 1)-dimensional experiment in literature with super-roughness. The results obtained from the dynamics study make manifest two very surprising features of tumor growth: Its dynamics is mainly due to contour cells and the tendency of an interface cell to duplicate is a function of the local curvature.[ S0031-9007(98)

The fine analysis of synaptic contacts is usually performed using transmission electron microscopy (TEM) and its combination with neuronal labeling techniques. However, the complex 3D architecture of neuronal samples calls for their reconstruction from serial sections. Here we show that focused ion beam/scanning electron microscopy (FIB/SEM) allows efficient, complete, and automatic 3D reconstruction of identified dendrites, including their spines and synapses, from GFP/DAB-labeled neurons, with a resolution comparable to that of TEM. We applied this technology to analyze the synaptogenesis of labeled adult-generated granule cells (GCs) in mice. 3D reconstruction of dendritic spines in GCs aged 3–4 and 8–9 weeks revealed two different stages of dendritic spine development and unexpected features of synapse formation, including vacant and branched dendritic spines and presynaptic terminals establishing synapses with up to 10 dendritic spines. Given the reliability, efficiency, and high resolution of FIB/SEM technology and the wide use of DAB in conventional EM, we consider FIB/SEM fundamental for the detailed characterization of identified synaptic contacts in neurons in a high-throughput manner.