We present an apparatus which is capable of small-angle x-ray scattering studies of polymer deformation at strain rates ranging from 49.6 μm/s to less than 0.033 μm/s and temperatures ranging from room (≊22 °C) to 120 °C. The system also includes a load cell for measuring the force applied to the sample and a symmetric stretching system to keep the sample centered in the x-ray beam.
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