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An X-ray diffraction procedure has been developed to measure accurately the textures of thin wires so that the texture variation across the wire radius may be obtained. Since X-rays penetrate no further than the surface of most metals, X-ray examination can be considered to be superficial for large wires but by thinning the wire it is possible to obtain the texture variation across its radius. When the diameter is very small, X-rays can penetrate a significant proportion of the wire. In these cases a new technique using the texture changes between several thinning procedures allows a precise understanding of the texture variation between the surface and the core of the wire. To illustrate the application of this procedure, some examples are given for 175 ~tm steel cord.

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