The objective of the present paper is to give an insight of the fundamental properties strongly depended on the crystallizing phase, grain size, thickness, including stoichiometry of material. The subject of this work is the lead zirconate titanate [Pb(Zr,Ti)O3, PZT] with its composition located at the morphotropic phase boundary (MPB) that were prepared by a solid state method [1] and a conventional sol-gel technique [2,3]. The samples prepared by the first methods are in a bulk form while the latter the multilayer. The physical property and the dielectric and piezoelectric properties of the PZT samples have been discussed comparatively when the sample size decreasing from the bulk to the thin-film scale.