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The problem of the current–voltage characteristics of thin semiconducting films has been investigated. The sandwich configuration of films with metal electrodes was used and measurements were performed by increasing and decreasing the current and voltage, respectively. It is shown that there is a hysteresis of the current–voltage characteristics in such dynamic regimes, caused by temperature changes in the samples. In the case of a current source a negative resistance of S‐type can occur, whilst the appropriate characteristics for the voltage source are of a monotonously increasing type. An experimental verification of the theoretical results is given for the sandwich structure metal–(thin film of the amorphous semiconductor CdTe)–metal.

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