Analysis of the generation-recombination processes by numerical simulation allows consideration of a very small recombination time constant in order to study the behavior of p-n junctions in this extreme situation. The generation-recombination current does not increase indefinitely as the generation or recombination mechanism is more and more active. Instead, current saturation occurs as a result of the continuity equation along with the generation-recombination expression. This generation-recombination current saturation takes place in any semiconductor and establishes the maximum current limit that can be yielded by this mechanism.
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