An automatic system is described for the measurement of intensities of X-ray reflections from single crystals. It is controlled by a programmable plugboard and punched paper tape output from an IBM 1620 computer. The goniometer used is the G.E. single crystal orienter. A circuit is provided which maximizes the counting rate before the intensity is measured.

An inexpensive and simple CRT system is described for displaying Fourier syntheses computed on a Data General Nova 1200 computer. The synthesis is computed and output on to the CRT screen, one level at a time, from which it is recorded on photographic film. Regions of high electron density appear as areas of high optical density on the photograph.