A new 17" x 17" immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide I Amorphous Silicon based technology, and give measurement results (MTF, DQE, stability). We compare the new detector performance to existing technologies (film I screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI I a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. ..) which have been up to now done using films.

A method for the determination of the depth distribution of light elements in heavy materials is described. It involves the detection of light elements recoiling under the bombardment by a 35Cl beam. A resolution of 300 Å was achieved for the lithium present in a thin sample. The measures were done with layers of 1016 atoms/cm2 and it is estimated that quantities as small as 1014 atoms/cm2 can be located without much difficulty.

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