This paper describes a way to develop magneto-optical waveguides via sol-gel process. They are made of cobalt ferrite nanoparticles embedded in a silica/zirconia matrix. Thin films are coated on glass substrate using the dip-coating technique. Annealing and UV treatment are applied to finalize sample preparation. Therefore, planar waveguides combining magneto-optical properties with a low refractive index (≈1,5) are obtained. M-lines and free space ellipsometry measurements show a specific Faraday rotation of 250°/cm and a modal birefringence of 1×10−4 at 820 nm. Thus, the mode conversion efficiency can reach a maximum value around 56%.

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The development of devices that combine a magnetic material with a semiconductor chip is a major focus of current research. Barium hexaferrite (BaFe12O19 or BaM) thick films are deposited here using a rf sputtering system. The films are amorphous and nonmagnetic after deposition. Postdeposition thermal annealings are employed to obtain magnetic properties. The effects of the substrate, thermal annealing and thickness of BaM on the magnetic properties are studied using a vibrating sample magnetometer. The initial results show good magnetic properties for the two subtrates studied and after thermal annealing above 800 °C. The magnetic properties of the thick films are close to the bulk (BaM) ones.

The annealing and relaxation of internal stresses in optical fibers are investigated. An empirical equation representing the relaxation is fitted and a result concerning the lifetime of optical-fiber cables is deduced.

Optical scatterometry has been given much credit during the past few years in the semiconductor industry. The geometry of an optical diffracted structure is deduced from the scattered intensity by solving an inverse problem. This step always requires a previously defined geometrical model. We develop an artificial neural network classifier whose purpose is to identify the structural geometry of a diffraction grating from its measured ellipsometric signature. This will take place before the characterization stage. Two types of geometry will be treated: sinusoidal and symmetric trapezoidal. Experimental results are performed on two manufactured samples: a sinusoidal photoresist grating deposited on a glass substrate and a trapezoidal grating etched on a SiO2 substrate with periods of 2 microm and 0.565 microm, respectively.