This paper introduces a novel method that allows fast and reliable extraction of material parameters in terahertz time-domain spectroscopy. This method could be applied for most of materials and requires neither simplifying assumptions nor samples of different thickness for the extraction. The presented extraction procedure operates either on truncated terahertz signals when temporal windowing is possible, or on full ones otherwise. Some experimental examples covering all practical cases are given. In particular, the extraction procedure treats the tedious case of samples for which internal reflections of the terahertz pulse slightly overlap.

Time-domain spectroscopy allows fast and broadband measurement of the optical constants of materials in the terahertz domain. We present a method that improves the determination of the optical constants through simultaneous determination of the sample thickness. This method could be applied to any material with moderate absorption and requires only two measurements of the temporal profile of the terahertz pulses: a reference one without the sample and one transmitted through the sample.

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