In general, an establishment of the traceability on high voltage and high-current measurement systems in approved testing laboratories can be made through the intercomparison test with the international reference system. This paper shows the results of inter-comparison between KERI and Asian STL(Shortcircuit Testing Liaison) reference shunt. The expanded measurement uncertainty was calculated with uncertainty components such as scale factor, non-linearity effect, interference effect and temperature effect. Also inter-laboratory comparison proficiency testing scheme for assuring the quality of the results in the high power testing laboratories is introduced. Consequently, the difference in scale factor of the shunts participating in the proficiency testing was calculated to be less than 0.2 %.

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