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~erroma~?etic resonance (F~R) and VSM te.chniques have been used to study the effects of sputtermg condltions on the formation of both vertical (growth direction) and lateral magnetic inhomogeneities in CoCr films on polyimid substrates. The thicknesses of vertical inhom~ge~eities (transition layers) were estimated by both FMR line intensities and jumps in magn~tiZation detected by VSM measurements. Lateral inhomogeneities were studied by FMR techmques and are explamed by Cr segregation to column boundaries. Recording performance data have been shown to correlate with the thicknesses of the transition layers.