Near edge X-ray absorption fine structure (NEXAFS) spectra were obtained using total electron yield detection for poly(butylene terephthalate) (PBT) and poly(ethylene terephthalate) (PET) and their model compounds 4,4′-biphenyldicarboxylic acid dimethyl ester (PAM), 4,4′-biphenyldicarboxylic acid (PCA), and terephthalic acid (TPA). The spectra of PBT and PET were interpreted with the comparison of the spectral features of model molecules and the polarized NEXAFS spectra of oriented films of PAM, PCA, and PBT. From the polarization dependence, the peaks previously ascribed to a C 1s f π*(ring) or π*(ring/CdO) excitation at 289.8 eV and an O 1s f 3p/Rydberg or f π*(CdO) transition at 536.4 eV were reassigned to a C 1s f σ*(O-CH x ) transition and an O 1s f σ*(O-CH x ) transition, respectively. The present results demonstrate that the polarization dependence of the NEXAFS spectra of oriented small analogous molecules are useful for the assignment of the NEXAFS spectra of polymers.

An ultra-thin DLP TM* rear projector composed of a refractive-reflective projection optics and an off-axis hybrid screen has been designed. The projection optics has extraordinarily large projection angle of 136 degrees with very low distortion, which is also applicable for a video-wall monitor as well as a stand-alone display. Results of prototype projection systems using the technology will be presented.

With a view to suppressing the overlap shift between the TFT substrate and the color filter substrate, application of UV sealant is considered in the LCD panel assembly process. The initial tensile strength and moisture resistance of the UV sealant are evaluated and studied. In regard to the initial tensile strength, the stress applied to the sealing part during the glass cutting process, in which the peeling of the seal is most likely, is quantized by a numerical method based on the finite element method. By comparison of this result with tensile intensity tests of the UV sealant, acceptable performance is confirmed. The resistance to moisture is degraded due to large distortions on the interface between the sealant and the glass substrate, since a UV sealant hardened only by UV light has a large shrinkage on solidifying. Such shrinkage is small in a UV sealant that is hardened completely by applying heat after illumination of UV light, and hence presents practically no problem, with a moisture resistance equal to that in conventional heat curing‐type sealant. From these results, the UV sealant completely hardened by applying heat after UV light illumination is found to be applicable to TFT‐LCD from the point of view of tensile strength and humidity resistance. © 2000 Scripta Technica, Electron Comm Jpn Pt 2, 83(5): 21–27, 2000

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