We have investigated ion desorption from single-walled carbon nanotubes (SWNTs) that is induced by soft X-ray illumination in the C 1s core-excitation energy range in order to have insight to the mechanism of defect formation caused by the similar excitation. The mass of desorbed ions was analyzed by a time of flight (TOF) spectrometer and the photon energy 2 dependence of the ion yield or the desorption efficiency spectra were measured as a function of the monochromatic photon energy used for illumination. Experimental results exclude the simple detachment of carbon atoms constituting the nanotubes from the cause of the defect formation.Also the photo-induced etching of carbon atoms associated with C-H bond rapture is ruled out from the defect formation mechanism. Auger mechanisms to explain the photo-induced desorption are discussed.

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