OPTICAL PROPERTIES OF DOUBLE-LAYER STRUCTURE PHTHALOCYANINE-TETRACYANOQUINODIMETHANE Z. I. Kazantseva, E. G. Bortchagovsky, I. A. KoshetsOptical properties of double-layer structures consisting of Cu-phthalocyanine vacuum evaporated film and Langmuir-Blodgett film of 7,8, were investigated by ellipsometry, photoconductivity and optical transmission. The obtained results indicate strong interaction between the materials; the resulting optical properties cannot be presented as the sum of those of the particular components. Two new effective absorption bands at 1.08 and 2.85 eV were found for such structures. The band at 2.85 eV coincides with a measured peak in photocurrent spectrum, which supports the idea on a charge transfer complex formation between Cu-phthalocyanine to TCNQ. Ìåòîäàìè åë³ïñîìåòð³¿, ôîòîïðîâ³äíîñò³ òà îïòè÷íîãî ïîãëèíàííÿ äîñë³äaeåí³ îïòè÷í³ âëàñòèâîñò³ á³øàðîâèõ ñòðóêòóð, óòâîðåíèõ òîíêèìè ïë³âêàìè íàïîðîøåíîãî â âàêóóì³ ôòà-ëîö³àí³íó ì³ä³ (CuPc) òà ïë³âêàìè Ëåíãìþðà-Áëîäaeåòò ïåíòàäåöèë 7,7,8,8-òåòðàö³àíî-1,4-õ³íîäèìåòàíàó (ïåíòàäåöèë TCNQ). Îòðèìàí³ ðåçóëüòàòè âêàçóþòü íà íàÿâí³ñòü âçàºìî䳿 ì³ae ðå÷îâèíàìè; îïòè÷í³ âëàñòèâîñò³ ñèñòåìè íå ìîaeóòü áóòè ïðåäñòàâëåí³ ÿê ïðîñòà ñóïåð-ïîçèö³ÿ ñêëàäîâèõ êîìïîíåíò. Ó ñïåêòð³ ïîãëèíàííÿ ñòðóêòóðè âèÿâëåíî äâ³ íîâ³ ñìóãè 1.08 ³ 2.85 eV. Ñìóãà 2.85 eV ñï³âïàäຠç ï³äâèùåííÿì ñèãíàëó â ñïåêòð³ ôîòîïðîâ³äíîñò³, ùî ñâ³-ä÷èòü íà êîðèñòü ã³ïîòåçè ïðî óòâîðåííÿ êîìïëåêñó ç ïåðåíîñîì çàðÿäó ì³ae CuPc ³ TCNQ.Êëþ÷îâ³ ñëîâà: îðãàí³÷í³ íàï³âïðîâ³äíèêè, åë³ïñîìåòð³ÿ, îïòè÷íà ñïåêòðîñêîï³ÿ, ôîòî-ïðîâ³äí³ñòü.Z. I. Kazantseva, E. G. Bortchagovsky, I. A. Koshets

Cu2ZnSnS4 (CZTS) thin films were deposited on glass substrates by spray pyrolysis a fast, cost effective and vacuum‐free method. X‐ray fluorescence, Raman spectroscopy and grazing incidence X‐ray diffraction, were used to characterize the obtained thin films. The analysis of these data showed a close to stoichiometry composition of the films and CZTS adopts the kesterite type structure but with poor crystalline quality and possible existence of secondary phases, such as ZnS and Cu2SnS3. An annealing procedure in presence of elemental Sn and S was applied in order to improve the quality of the films. The annealing leads to an improvement of the crystalline quality of the thin films. The lattice parameters a and c of the annealed CZTS thin films were obtained as result of the Rietveld analysis of the gracing incidence X‐ray diffraction data. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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