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It was found that 20 : 5 and 40 : 10 siloxane block copolymers of the general formula {( CH 3 ) 2 SiO } m {[ C 6 H 5 SiO 1.5 ] a [ C 6 H 5 SiO · ( OH )] 1 -a } n are structurally different: the 20 : 5 siloxane block copolymers consisted of 8-10 pairs of blocks, whereas the 40 : 10 siloxane block copolymers consisted of 1-2 pairs of blocks. The diffraction patterns of the initial 20 : 5 siloxane block copolymers were characterized by two reflections with 2 θ maximums at 7.7° and 12.2° , whereas the diffraction patterns of the initial 40 : 10 siloxane block copolymers were characterized by a reflection with a 2 θ maximum of ~8.3 ° . After irradiation to a dose higher than the dose of gelation (~100 kGy), two reflections with maximums at ~7.6° and 12.5° appeared in the diffraction pattern of 40 : 10 siloxane block copolymers. This suggests a structural rearrangement and offers possibilities for the radiation crosslinking and regulation of the supramolecular structure of block copolymers.

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